On-line wafer thickness measurement during grinding

The semiconductor and electronic industry is depending on high quality standards.   Therefore they profit from the high precision of the CHRocodiles with a lateral resolution of microns and height resolution of submicrons.

Typical Applications:

 – measurement of structures on semiconductors

 – manufacturing of masks,
 – quality assurance on bondings (length of leads etc.),
 – measurement of transparent coatings,
 – determination of varnish thickness (e.g. photo lacquer or damping layer on ICs).