Photovoltaic Industry – measurement of multilayer systems, transparent coatings and foils
Non-contact distance and layer thickness measurements on Wafers, Solar Cells and Modules |
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| The new CHRocodile IT performs high-precision, noncontact distance and layer thickness measurements on wafers, solar cells and modules. With a single measuring head, it is capable of measuring up to 1mm thick silicon. Measurements can also be taken on other common infrared transparent materials, such as GaAs. |  |
| The basis for this new, nondestructive measuring method is an interferometric sensor which examines the substrate with infrared light. The CHRocodile IT is designed for simple and direct integration into the production process. However, it also serves as an economic and precise measuring tool for laboratory use. | |
