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Photovoltaic Industry – measurement of multilayer systems, transparent coatings and foils


Non-contact distance and layer thickness measurements on Wafers, Solar Cells and Modules

The new CHRocodile IT performs high-precision, noncontact distance and layer thickness measurements on wafers, solar cells and modules.   With a single measuring head, it is capable of measuring up to 1mm thick silicon. Measurements can also be taken on other common infrared transparent materials, such as GaAs. images/MApp05_Photovoltaic.jpg
The basis for this new, nondestructive measuring method is an interferometric sensor which examines the substrate with infrared light.   The CHRocodile IT is designed for simple and direct integration into the production process. However, it also serves as an economic and precise measuring tool for laboratory use.
http://laserage.eu/wp-content/uploads/2017/03/0000pdf-hi-res.jpg Datasheet – non-contact measurement of Wafers and Solar Cells
http://laserage.eu/wp-content/uploads/2017/03/0000pdf-hi-res.jpg Datasheet – CHRocodile IT measures Wafers and Solar Cells 
http://laserage.eu/wp-content/uploads/2017/03/0000pdf-hi-res.jpg Datasheet – 5 Channel Optical Sensor measures Wafers and Solar Cells
http://laserage.eu/wp-content/uploads/2017/03/0000pdf-hi-res.jpg Presentation – Measurement on Wafers and Solar Cells